Haoran Cheng, Yamin Pan, Xin Wang, Chuntai Liu, Changyu Shen, Dirk W. Schubert,Zhanhu Guo, Xianhu Liu?

The original version of this article unfortunately contained some mistakes. The corrections are updated as follows:

Error 2:

In the page 7, “Since N Ni/MXene?MF possessed numer?ous heterogeneous interfaces and abundant functional groups, the dielectric loss mechanism was explored.”

Should be:

“Since Ni/MXene?MF possessed numerous heterogeneous interfaces and abundant functional groups, the dielectric loss mechanism was explored.”

Error 3:

In the page 8, “In particular, a strong RLmin of 62.7 dB with the EAB of 6.24 GHz at the ultrathin thickness of 2 mm.”

Should be:

In the page 8, “In particular, a strong RLminof - 62.7 dB with the EAB of 6.24 GHz at the ultrathin thickness of 2 mm.”

Error 4:

In the page 8, “Here, the impedance matching was evalu?ated by introducing the |Zin/Z0| value, which can be calcu?lated based on Eq. 5”; and, in the page 9, “Based on Eq. 4”.Should be:

“Here, the impedance matching was evaluated by intro?ducing the |Zin/Z0| value, which can be calculated based on Eq. 6”; and “Based on Eq. 7”.

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